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Listing of all the works of the author. Click on the work title to get the full information.
Semenov A.V., Fedorec V.N., Starcev V.N.
Homogeneity Lot of Integrated Circuit Inspection based on Radiofrequency Measurement
Semenov A.V., Starcev V.N., Stepanov E.N.
Technometric Identification of Integrated Circuits for Controlling Life Cycle and Counterfeit Detection
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