Home         Authors   Papers   Year of conference   Themes   Organizations        To MES conference

Starcev V.N.

Listing of all the works of the author. Click on the work title to get the full information.

2016 
 Semenov A.V., Fedorec V.N., Starcev V.N.
Homogeneity Lot of Integrated Circuit Inspection based on Radiofrequency Measurement
2018 
 Semenov A.V., Starcev V.N., Stepanov E.N.
Technometric Identification of Integrated Circuits for Controlling Life Cycle and Counterfeit Detection
 

Copyright 2009-2019 IPPM RAS. All Rights Reserved.

Design of site: IPPM RAS