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Listing of all the works of the author. Click on the work title to get the full information.
Andrienko V.A., Ryabtsev V.G., Utkina T.Yu.
Method and means of built-in self-testing of memory chip
Ryabtsev V.G., Shubovich A.A., Feklistov A.S.
Diagnostic facilities and configurable digital systems on crystal portable integration
Evdokimov A.P., Ryabtsev V.G., Melikov A.V.
Principles of Designing Devices for Test Diagnosing of High-speed Microchips and Semiconductor Memory
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