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Reduction of influence of single interference in submicronic trigger memory cells

Authors
 Zharkov I.A.
 Krasnyuk A.A.
 Stenin V.Ya.
Date of publication
 2006

Abstract
 Results of modelling of single failures in submicronic trigger cells of memory are presented. Recommendations at the choice of values of integrated correcting RC-chains are given.
Keywords
 single failures, memory cells
Library reference
 Zharkov I.A., Krasnyuk A.A., Stenin V.Ya. Reduction of influence of single interference in submicronic trigger memory cells // Problems of Perspective Microelectronic Systems Development - 2006. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2006. P. 413-415.
URL of paper
 http://www.mes-conference.ru/data/year2006/75.pdf

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