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Method of rule checks of electromigration in VLSI

Authors
 Melikyan V.Sh.
Date of publication
 2008

Abstract
 A new method for checking the rules of electromigration in VLSI, as well as the possibility of an appropriate software package, taking into account the realities of sub-micron technologies and meeting the practical requirements of modern VLSI design is presented.
Keywords
 design rule check, electromigration, VLSI
Library reference
 Melikyan V.Sh. Method of rule checks of electromigration in VLSI // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2008. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2008. P. 159-163.
URL of paper
 http://www.mes-conference.ru/data/year2008/26.pdf

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