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Prospects of using submicronic CMOS VLSI in failure-proof equipment working under impact of atmospheric neutrons

Authors
 Stenin V.Ya.
 Betelin V.B.
 Bobkov S.G.
 Krasnyuk A.A.
 Osipenko P.N.
 Cherkasov I.G.
 Chumakov A.I.
 Yanenko A.V.
Date of publication
 2008

Abstract
 Main effects of impact of atmospheric neutrons on VLSI are single failures and thyristor effects which elimination is a subject of designing both failure-proof VLSI and equipments.
Keywords
 failure-proof equipment, impact of atmospheric neutrons, VLSI
Library reference
 Stenin V.Ya., Betelin V.B., Bobkov S.G., Krasnyuk A.A., Osipenko P.N., Cherkasov I.G., Chumakov A.I., Yanenko A.V. Prospects of using submicronic CMOS VLSI in failure-proof equipment working under impact of atmospheric neutrons // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2008. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2008. P. 256-259.
URL of paper
 http://www.mes-conference.ru/data/year2008/46.pdf

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