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Simulation of SEU failures in submicronic SoS CMOS cells of memory in view of temperature effects

Authors
 Krasnyuk A.A.
 Stenin V.Ya.
Date of publication
 2005

Abstract
 It is carried out the researches showing an admissibility of application SPICE simulation for research SEU failures in symmetric trigger cells of memory, and also allowing how to simply enough to estimate influence of temperature on characteristics failure-proof.
Keywords
 Simulation of SEU failures, submicronic SoS CMOS cells of memory
Library reference
 Krasnyuk A.A., Stenin V.Ya. Simulation of SEU failures in submicronic SoS CMOS cells of memory in view of temperature effects // Problems of Perspective Microelectronic Systems Development - 2005. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2005. P. 191-195.
URL of paper
 http://www.mes-conference.ru/data/year2005/28.doc

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