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Methods to control the hardness of specialized VLSI to space natural ionizing radiation

Authors
 Anashin V.S.
 Ishutin I.O.
 Ulimov V.N.
 Emeliyanov V.V.
Date of publication
 2010

Abstract
 The article describes the routine to control hardness to space ionizing radiation (tests and estimations) of electronic components, designed for space applications. Test equipment for fixation of single event effects, created by JSC “INSTITUTE OF SPACE DEVICE ENGINEERING” is also considered.
Keywords
 space ionizing radiation, electronic components, control methods, single event effects, test equipment.
Library reference
 Anashin V.S., Ishutin I.O., Ulimov V.N., Emeliyanov V.V. Methods to control the hardness of specialized VLSI to space natural ionizing radiation // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2010. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2010. P. 233-236.
URL of paper
 http://www.mes-conference.ru/data/year2010/papers/m10-20-92881.pdf

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