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Parameters extraction of the scaled MOS-transistor model

Authors
 Nelayev V.V.
 Krasikov M.G.
 Bozhatkin O.A.
 Kuntsevich V.V.
 Syakersky V.S.
Date of publication
 2010

Abstract
 Algorithms and software for SPICE-parameters extraction are presented. Extraction is performed on the base of natural or computer experiments.
Keywords
 SPICE-parameters, extraction, MOS-transistor, BSIM3 model
Library reference
 Nelayev V.V., Krasikov M.G., Bozhatkin O.A., Kuntsevich V.V., Syakersky V.S. Parameters extraction of the scaled MOS-transistor model // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2010. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2010. P. 54-59.
URL of paper
 http://www.mes-conference.ru/data/year2010/papers/m10-239-84481.pdf

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