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Features of application ECC methods in sub-100 nm SRAMs for space systems

Authors
 Krasnyuk A.A.
 Petrov K.A.
Date of publication
 2012

Abstract
 It is considered the basic and advanced multiple errors correction methods in sub-100nm SRAMs for space systems
Keywords
 Static RAM (SRAM), TID and SEE radiation effects, Error-Correction Codes, Hamming codes.
Library reference
 Krasnyuk A.A., Petrov K.A. Features of application ECC methods in sub-100 nm SRAMs for space systems // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2012. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2012. P. 638-641.
URL of paper
 http://www.mes-conference.ru/data/year2012/pdf/D125.pdf

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