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Numerical model for MISFETs characterization

Authors
 Krupkina T.Yu.
 Krasukov A.Yu.
 Artamonova Ye.A.
Date of publication
 2014

Abstract
 One dimensional numerical model for MIS-structures and MISFETs characterization is presented. Model is based on solving the Poisson equation in a multi-layer structure. Model capabilities were considered in several examples
Keywords
 MIS-structure, numerical simulation
Library reference
 Krupkina T.Yu., Krasukov A.Yu., Artamonova Ye.A. Numerical model for MISFETs characterization // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2014. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2014. Part 2. P. 159-162.
URL of paper
 http://www.mes-conference.ru/data/year2014/pdf/D009.pdf

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