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Unified approach to radiation hardness assurance of high-speed ASICs

Authors
 Anashin V.S.
 Rutkevich A.V.
 Voronkov D.I.
 Kozukov A.
 Korolev V.S.
 Sysoev I.Y.
Date of publication
 2014

Abstract
 The paper presents the unified approach to radiation hardness assurance of ASICs. This technique should exclude long line effects and simplify testing preparation. A new hardware platform was developed for this purpose. It was used for radiation hardness assurance of two ASICs. The testing results have been presented in the last part of the paper.
Keywords
 ASIC, radiation hardness assurance, heavy ions, hardware platform, research, chip, technique
Library reference
 Anashin V.S., Rutkevich A.V., Voronkov D.I., Kozukov A., Korolev V.S., Sysoev I.Y. Unified approach to radiation hardness assurance of high-speed ASICs // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2014. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2014. Part 3. P. 185-188.
URL of paper
 http://www.mes-conference.ru/data/year2014/pdf/D109.pdf

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