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SEE sensitivity changes at different TID levels

Authors
 Novikov A.A.
 Pechenkin A.A.
 Ryasnoy N.V.
 Chumakov A.I.
Date of publication
 2014

Abstract
 SEU, SEL and SET sensitivity estimation results using laser technique in dependency of TID effects are presented and discussed
Keywords
 SEU, SEL, SET, TID, laser technique, ion radiation
Library reference
 Novikov A.A., Pechenkin A.A., Ryasnoy N.V., Chumakov A.I. SEE sensitivity changes at different TID levels // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2014. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2014. Part 3. P. 159-162.
URL of paper
 http://www.mes-conference.ru/data/year2014/pdf/D131.pdf

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