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Methods to improve efficiency of microprocessor model stochastic tests  

Authors
 Grevtsev N.A.
 Khisambeev I.Sh.
 Chibisov P.A.
Date of publication
 2016

Abstract
 This article describes the method of microprocessor functional verification based on building a functional coverage model with the involvement of testing knowledge. The coverage models are used for measuring, monitoring and changing the direction of stochastic testing process. According to the proposed procedure coverage metrics at the level of instruction set architecture are involved, analysis of coverage data is carrying out and the efficiency of stochastic testing is evaluated.
Keywords
 functional verification, RTL – model of microprocessor, stochastic testing, functional coverage metrics, coverage model, pseudorandom tests generation.
Library reference
 Grevtsev N.A., Khisambeev I.Sh., Chibisov P.A. Methods to improve efficiency of microprocessor model stochastic tests // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2016. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2016. Part 2. P. 8-15.
URL of paper
 http://www.mes-conference.ru/data/year2016/pdf/D128.pdf

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