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Methods of statistical timing analysis of digital circuits

Authors
 Glebov A.L.
Date of publication
 2005

Abstract
 Increase of a degree of integration of digital VLSI and reduction of the minimal sizes of elements with moving into submicron area brings to the forefront a problem of increase of VLSI reliability at design stage. The essential factors influencing for work of the circuit, become statistical variations as external conditions in which the circuit works, and parameters of elements of the scheme. Changes of temperature, supply voltage, various degradation cases, all casual changes of the sizes of transistors may be qualified as variations of external conditions.
The purpose of this work is the solution of the specified problem by development of methods and algorithms of the statistical timing analysis for digital ciruits, and also performing numerical experiments with the specified methods and algorithms.
Keywords
 statistical analysis, timing analysis, digital circuits
Library reference
 Glebov A.L. Methods of statistical timing analysis of digital circuits // Problems of Perspective Microelectronic Systems Development - 2005. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2005. P. 60-65.
URL of paper
 http://www.mes-conference.ru/data/year2005/09.doc

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